relative reliability meaning in Chinese

相对可靠性

First , the scaling limitation and relative reliability problems are analyzed for mosfet in vlsi , especially for hot - carrier effects of small dimension mosfet . and a review of the study of hot - carrier effects on devices and circuits is presented
首先，本文对超大规模集成电路中mos器件尺寸缩小的限制及相应的可靠性问题进行了分析，特别是对小尺寸mosfet的热载流子效应进行了较详细的讨论；并对国内外mos器件和电路的热载流子可靠性研究进行了概述。